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Datasheet
2470 Graphical SourceMeter SMU Instrument Datasheet

1KW-61523-0 | Date: Wednesday, August 09 2023
Technical Document
Source Measure Unit (SMU) Instruments Selector Guide

MAKE MULTIPLE MEASUREMENTS ACCURATELY USING A SINGLE INSTRUMENT A source measure unit (SMU) instrument is a five-in-one tool. It combines the useful features of a digital multimeter (DMM), power supply, current …

1KW-61458-2 | Date: Tuesday, August 24 2021
Technical Document
Keithley Instrumentation for Electrochemical Test Methods and Applications

This application note discusses a variety of electrochemical applications, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, electrical device characterization, and other tests that involve sourcing and measuring current and voltage and measuring capacitance with high accuracy.

1KW-60158-1 | Date: Wednesday, April 25 2018
Blog Entry
Kirchhoff’s Law saves the day when you need more power!

You’re designing a new device/component and you just realized that the source measure unit (SMU) instrument that you have been using to perform I-V characterization doesn’t have enough power to test …

마지막 업데이트: Tuesday, August 1, 2023
Blog Entry
How Keithley’s New 2601B-PULSE Can Help VCSEL Designers Save More Lives

It’s late at night and you’re driving home. You’re tired and just want to get to bed. But then, all of a sudden, you are faced with a big animal in the middle of the road. Immediately, your car slams …

마지막 업데이트: Tuesday, August 1, 2023
Technical Document
Tips and Techniques for Efficient DC Testing and Current-Voltage Characterization

This e-guide explores some of the most common DC current vs. voltage (I-V) tests being performed today, the seemingly inherent complications posed by each, and how new techniques can help to not only overcome these challenges but enhance efficiency and productivity, as well.

Date: Tuesday, June 30 2015
Technical Document
Advancing Techniques of Failure Analysis Using Source Measure Units and Lock-in Thermography

Introduction Semiconductor devices have not only advanced in capability but continue to dimensionally shrink. New devices are developed everyday that are used in applications we take for granted in tablets, phones, entertainment …

1KW-73762-0 | Date: Tuesday, November 10 2020
Technical Document
Simplifying FET Testing with Series 2600B System SourceMeter SMU Instruments

This application note explains how to simplify I-V measurements on FETs using a Series 2600B System SourceMeter SMU Instrument with the TSP® Express embedded software tool.

1KW-57501-1 | Date: Friday, September 16 2016
Blog Entry
How to Measure a MOSFET I-V Curve

One of the best ways to ensure a MOSFET is functioning properly and meets specifications is to determine its characteristics by tracing I-V curves. There are a number of output characteristics …

마지막 업데이트: Wednesday, December 27, 2023
Blog Entry
Electrochemical Biosensor Qualification

Ever since I received one of those wrist worn fitness trackers for Christmas, I’ve been amazed at how sensor technology continues to evolve, especially to improve our health. I’ve been reading many …

마지막 업데이트: Tuesday, August 1, 2023