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DDR 테스트, 검증 및 디버그

DDR 메모리 인터페이스

DDR4 및 LPDDR4와 같은 차세대 메모리 기술은 여러 애플리케이션 요구 사항을 충족하기 위해 더 빠른 속도, 낮은 I/O 전압 및 다양한 폼팩터를 제공합니다. 이로 인해 보다 엄격한 마진, 에지 속도 상승, 복잡한 버스 프로토콜 등의 새로운 디버그 및 검증 관련 문제가 발생합니다.

텍트로닉스는 메모리 검증 및 디버그를 위한 가장 포괄적인 도구 집합을 제공합니다.

Library
Title
DesignCon 2015 Paper - Designing High Performance Interposers with 3-port and 6-port S-parameters
This technical paper explains how multiport S-parameters can be used to validate memory interposer design cases. This helps memory designers understand some of the performance characteristics that can...
The NEW P7700 Series TriMode Probe provides the highest probe fidelity available for real-time oscilloscopes. Watch our 60-second video to see how this new probe can help minimize noise and easily...
55s
The MSO/DPO70000 Series oscilloscope delivers exceptional signal acquisition performance and analysis capability. Discover your real signals and capture more signal details with the industry's hig...
5m 50s
The Tektronix P7700 TriMode Probe supports solder connections to a device under test. In this video, you will learn the Tektronix recommended procedure for attaching a solder tip to a device.
5m 59s
Title
Efficiently Design and Electrically Validate a DDR4 Interface
This webinar will show how Cadence and Tektronix can enable you with flexible and power efficient DDR4 IP, design and analysis tools used in the office, and lab-based solutions to address the key chal...
Memory Interface Verification and Debug
This webinar will explain how to prepare for next generation DDR-based memory testing. Learn about the changes these new standards bring to electrical verification and how to prepare for proper signal...
New Characterization Techniques for DDR4-LPDDR4 and Next Generation Memory Standards
This webinar provides an update on the latest characterization and debug techniques to enable analysis of the highest DDR4/LPDDR4 speed grades (DDR4-3200/LPDDR4-4266). Learn about: • New probing techn...