Option MHD and Option MHD3

The TekExpress MHL Advanced Analysis and Compliance software gives you the tools to easily run Mobile High-definition Link (MHL) tests in accordance with MHL compliance test specifications 1.X, 2.0, 1.3 / 2.1 and 3.2. It provides a complete and reliable solution for quick testing.

Key features

• Conformance to MHL 3.2 Compliance Test Specification (CTS) ensures reliable results for Source, Sink, Dongle Output/Input group of tests introduced in MHL 3.2 
• Conformance to MHL 1.1/1.2/2.0 and 1.3/2.1 Compliance Test Specification (CTS) ensures reliable results including support for direct attach device testing, cable electrical testing
• Complete validation to standards with a wide range of tests for transmitter and receiver (Sink / Dongle) devices and both physical layer and link layer testing
• Single-box physical and link layer enables seamless testing and analysis from physical layer to link layer and back
• Accurate tests using precise measurement techniques
• Automated receiver/dongle tests - simple setup with all impairments added to the MHL signals using the direct synthesis based capability of the AWG
• Path-breaking direct synthesis method for receiver testing
  • Removes the dependency on hardware elements such as ISI Boards
  • True MHL signal generation without depending on external combiners
• Get quick results with automatic mask-fit, measurements, and Pass/Fail notification
• Simple test setup ensures faster test times and greater repeatability
• Ensure faster testing with one-button selection of multiple MHL Tests
• Save time with one-button MHT/.PDF format summary and reports
• Single compliance solution to meet the MHL 1.1, 1.2, 2.0, 1.3, 2.1, and 3.2 Compliance Test Specification (CTS) using real time oscilloscopes, probes, signal sources, a complete test fixture set, and sampling scopes with innovative IConnect® software

Applications

• Design and validation of MHL physical layer and protocol layer
• MHL3.2 DUT automation support for Source and Sink Input/Output groups using SL403 and RELT board from Silicon Image
• Autocal support for MHL3.2 Transmitter Input group measurements

Mobile high-definition link (MHL) compliance

Engineers designing and validating the MHL physical layer and link layer of their devices face constant pressure to improve efficiency. Engineers need to perform a wide range of compliance tests quickly and reliably right on their bench.

The MHL 1.1/1.2/1.3/2.0/2.1/3.2 specifications support MHL, which enables mobile devices to transmit uncompressed audio/video to an HDTV or receiver with HD capability. Option MHD and MHD3 Advanced Analysis and Compliance Test Software meets the MHL 1.1/1.2/1.3/2.0/2.1/3.2 CTS specification and automates a comprehensive range of tests, enabling unprecedented efficiency with reliable results. TEK-PGY-MHL-PA-SW MHL Protocol Analyzer Software supports up to 1.1/1.2/2.0 and 1.3/2.1 CTS specification.

Reliable and dependable results

Option MHD and MHD3 software embeds the MHL CTS 1.1/1.2/2.0 and CTS 1.3/2.1/3.2 compliance test procedures, ensuring dependable results. Accurate jitter testing and precise violation testing delivers higher credibility. Perform transmitter tests with simple setups that eliminate nonlinearity. Authentic measurement techniques and automation eliminate errors to provide faster test times.

Option MHD and MHD3 leverages the TekExpress capability to provide smooth multi-equipment interactions, providing an automated solution for transmitter, sink, and dongle testing. The direct synthesis method ensures greater repeatability:

• Eliminates the dependency on hardware PCB traces to insert jitter components
• Eliminates the need to combine common mode clock and differential data signals using hardware combiners

 

MHL 1.3/2.1 transmitter test setup for all other differential, common mode, and single ended tests

MHL 1.3/2.1 Clock Jitter and Data Eye Diagram test setup

MHL 1.3/2.1 Sink setup

MHL 1.3/2.1 Dongle setup

MHL 1.3/2.1 Sink Min/Max setup

MHL 1.3/2.1 Dongle Min/Max setup

MHL 3.2 Transmitter output

MHL3.2 Transmitter input calibration

MHL 3.2 Transmitter input

MHL 3.2 Receiver output

MHL 3.2 Receiver input

MHL protocol multi view display.

MHL physical and protocol layer seamless link capability

TEK-PGY-MHL-PA-SW

Third-party MHL Protocol Analyzer Software running on a Tektronix Real Time Oscilloscope embeds link-layer test procedures defined in MHL CTS 1.1/1.2/2.0 and CTS 1.3/2.1 and provides a unique one-box solution to MHL design, testing, and validation engineers to seamlessly migrate from physical layer to link layer.

Faster validation cycles

The unparalleled automation provided by Option MHD/MHD3 and Direct Synthesis capability of the Arbitrary Waveform Generators enables faster validation and shrinks test times for MHL testing. Demonstrate efficiency by using the "Select All" feature to perform multiple MHL transmitter tests. Instantly generate .CSV-format summaries or detailed reports at the press of a button.

Option MHD/MHD3 enables faster test times with automatic setting of the oscilloscope parameters and V termination voltage needs for MHL testing. This removes the inaccuracy and rigidity of MHL testing. Leveraging the Direct Synthesis capability of our industry-leading AWGs, in accordance with CTS 1.1, 1.2, 1.3, 2.0, 2.1, and 3.2.

Complete solution for validation

Option MHD and TEK-PGY-MHL-PA-SW offer a wide range of tests enabling thorough verification to standards. Tests offered include automated transmitter, AWG setup file based receiver/dongle, and MHL protocol tests. Perform convincing validation using a complete solution that includes oscilloscopes, probes, arbitrary waveform generators, test fixtures, and TDR.

Characteristics

Physical layer tests

MHL 1.3/2.1 Transmitter tests (supports Direct Attach Device testing)

• 3.1.1.1 Standby Output Voltage V_OFF
• 3.1.1.2 Single-ended High-level Voltage V_{SE_HIGH}
• 3.1.1.3 Single-ended Low-level Voltage V_{SE_LOW}
• 3.1.1.4 Differential Output Swing Voltage V_DFSWING
• 3.1.1.5 Common Mode Output Swing Voltage V_CMSWING
• 3.1.1.6 Differential Rise and Fall Times T_{R_DF}, T_{F_DF}
• 3.1.1.7 Common Mode Rise and Fall Times T_{R_CM}, T_{F_CM}
• 3.1.1.8 Differential Intra Pair Skew T_{SKEW_DF}
• 3.1.1.10 MHL Clock Duty Cycle in Normal mode (not needed for CTS 2.1)
• 3.1.1.11 MHL Clock Jitter in Normal mode (replaced by 3.1.1.17)
• 3.1.1.12 MHL Data Eye Diagram in Normal mode (replaced by 3.1.1.18)
• 3.1.1.14 MHL Clock Duty Cycle in PackedPixel mode
• 3.1.1.15 MHL Clock Jitter in PackedPixel mode (replaced by 3.1.1.19)
• 3.1.1.16 MHL Data Eye diagram in Packed Pixel mode (replaced by 3.1.1.20)
• 3.1.1.17 TP2 Clock Jitter in Normal mode (new test for CTS 1.3/2.1)
• 3.1.1.18 Data Eye Diagram in Normal mode (new test for CTS 1.3/2.1)
• 3.1.1.19 TP2 Clock Jitter in Packed Pixel mode (new test for CTS 1.3/2.1)
• 3.1.1.20 Data Eye Diagram in Packed Pixel mode (new test for CTS 1.3/2.1)

 

MHL 1.3/2.1 Receiver tests (supports Direct Attach Device testing)

• 4.1.1.1 Input Signal DC Voltage Level Tolerance
• 4.1.1.2 Input Signal Minimum and Maximum Swing Voltage Level Tolerance
• 4.1.1.3 Intra Pair Skew Tolerance
• 4.1.1.4 Jitter Tolerance in Normal mode
• 4.1.1.8 Jitter Tolerance in PackedPixel mode

 

MHL 1.3/2.1 Dongle tests

• 5.1.1.1 Input Signal Single-ended Voltage Level Tolerance
• 5.1.1.2 Input Signal Minimum and Maximum Swing Voltage Level Tolerance
• 5.1.1.3 Intra Pair Skew Tolerance
• 5.1.1.4 Jitter Tolerance in Normal mode
• 4.1.1.9 Jitter Tolerance in PackedPixel mode

 

MHL 1.3/2.1 Cable Electrical tests

• 7.2.1.16 Minimum CLK Swing
• 7.2.1.17 Data Eye Diagram

 

MHL 1.3/2.1 Cable Assembly tests (MOI based)

• 7.2.1.2 Differential Intra Pair Skew
• 7.2.1.3 Common Mode Intra Pair Skew
• 7.2.1.4 Differential Characteristic Impedance
• 7.2.1.5 Common Mode Characteristic Impedance
• 7.2.1.6 CBUS Line Capacitance
• 7.2.1.7 CBUS Cable Delay
• 7.2.1.8 Differential Insertion Loss
• 7.2.1.9 Common Mode Insertion Loss
• 7.2.1.10 Differential and Common Mode Conversion
• 7.2.1.11 CBUS Insertion Loss
• 7.2.1.12 Far End Cross talk
• 7.2.1.13 VBUS Drop (uses Keithley source meter)
• 7.2.1.14 Ground Resistance and Ground Shift (uses Keithley source meter)
• 7.2.1.15 MHL Cable Detect (MHL Cable with HDMI Type A Plug - uses Fluke DMM)

 

MHL 3.2 Transmitter Output tests

TMDS Data tests

• 3.7.2.1 Single-Ended High Level Output Voltage of Differential TMDS Data+/-
• 3.7.2.2 Single-Ended Low Level Output Voltage of Differential TMDS Data+/-
• 3.7.2.5 Differential Output Swing Voltage of Differential TMDS Data
• 3.7.2.13 Rise Time of Differential TMDS Data
• 3.7.2.17 Peak-Peak Amplitude of Differential TMDS Data
• 3.7.2.27 TMDS Data Eye Diagram

 

MHL Clock

• 3.7.2.7 Single-Ended High Level Output Voltage of Single-Ended MHL Clock
• 3.7.2.8 Single-Ended Low Level Output Voltage of Single-Ended MHL Clock
• 3.7.2.9 Single-Ended Output Swing Voltage of Single-Ended MHL Clock
• 3.7.2.20 Single-Ended MHL Clock Frequency
• 3.7.2.21 Single-Ended MHL Clock Front Porch
• 3.7.2.22 Single-Ended MHL Clock Back Porch
• 3.7.2.23 Rise Time of Single-ended MHL Clock
• 3.7.2.26 Single-Ended MHL Clock Jitter at TP2

 

MHL eCBUS

• 3.7.2.7 Single-Ended High Level Output Voltage of Single-Ended eCBUS Forward Data
• 3.7.2.8 Single-Ended Low Level Output Voltage of Single-Ended eCBUS Forward Data
• 3.7.2.9 Single-Ended Output Swing Voltage of Single-Ended eCBUS Forward Data
• 3.7.2.24 Fall Time of Single-Ended MHL Clock and eCBUS Forward Data
• 3.7.2.25 Peak-Peak Amplitude of eCBUS-S Forward Data
• 3.7.2.29 eCBUS FWD Data Eye Diagram at TP2

 

MHL 3.2 Transmitter Input tests

MHL eCBUS

• 3.7.2.32 Input DC Voltage Tolerance of eCBUS-S BWD Data
• 3.7.2.36 Jitter Tolerance of eCBUS-S BWD Data
• Auto Calibration (for 3.7.2.36 Jitter Tolerance of eCBUS-S BWD Data)

 

MHL 3.2 Receiver Output tests

MHL Sink eCBUS-S BWD

• 4.7.2.14 Single-Ended High Level Output Voltage of eCBUS-S Backward Data
• 4.7.2.15 Single-Ended Low Level Output Voltage of eCBUS-S Backward Data
• 4.7.2.16 Single-Ended Output Swing Voltage of eCBUS-S Backward Data
• 4.7.2.20 Rise Time of eCBUS-S Backward Data
• 4.7.2.21 Fall Time of eCBUS-S Backward Data
• 4.7.2.22 Peak-Peak Amplitude of eCBUS-S Backward Data
• 4.7.2.24 eCBUS-S Backward Data Eye Diagram at TP1

 

MHL Dongle eCBUS S BWD

• 5.7.2.16 Output DC Voltage of eCBUS-S BWD Data
• 5.7.2.17 Single-Ended Output Swing Voltage of eCBUS-S Backward Data
• 5.7.2.19 eCBUS-S Backward Data Eye Diagram at TP3

 

MHL 3.2 Receiver Input tests

MHL Sink

• 4.7.2.1 Input DC Voltage Tolerance of Differential TMDS data
• 4.7.2.3 Differential Input Swing Voltage Tolerance of Differential TMDS Data
• 4.7.2.5 Input DC Voltage Tolerance of Single-Ended MHL Clock and eCBUS-S Forward Data
• 4.7.2.7 Differential Intra-pair Skew Tolerance of Differential TMDS Data
• 4.7.2.10 Jitter Tolerance of Single-ended MHL Clock

 

MHL Dongle

• 5.7.2.1 Single-ended High Level Input Voltage Tolerance of Differential TMDS Data
• 5.7.2.2 Single-ended Low Level Input Voltage Tolerance of Differential TMDS Data
• 5.7.2.5 Differential Input Swing Voltage Tolerance of Differential TMDS Data
• 5.7.2.7 Single-ended High Level Input Voltage Tolerance of Single-ended MHL Clock and eCBUS-S Forward Data
• 5.7.2.8 Single-ended Low Level Input Voltage Tolerance of Single-ended MHL Clock and eCBUS-S Forward Data
• 5.7.2.10 Differential Intra-pair Skew Tolerance of Differential TMDS Data
• 5.7.2.13 Jitter Tolerance of Single-ended MHL Clock

 

MHL 2.1 Sink and Dongle system tests supported by AWG

TMDS Coding tests

• 4.2.1.1 and 5.2.1.1 Character Synchronization in Normal mode
• 4.2.1.2 and 5.2.1.2 Packet Types in Normal mode
• 4.2.1.3 and 5.2.1.3 Character Synchronization in PackedPixel mode
• 4.2.1.4 and 5.2.1.4 Packet Types in PackedPixel mode

 

Video tests

• 4.2.2.1 and 5.2.2.1 Video Formats in Normal mode
• 4.2.2.2 and 5.2.2.2 Pixel encoding in Normal mode
• 4.2.2.3 and 5.2.2.3 Video Quantization Range
• 4.2.2.4 and 5.2.2.4 Video Formats in PackedPixel mode
• 4.2.2.5 and 5.2.2.5 Pixel encoding in PackedPixel mode

 

Audio tests

• 4.2.3.1 and 5.2.3.1 IEC60958/IEC61937
• 4.2.3.2 and 5.2.3.2 Audio Clock regeneration

 

3D Video tests

• 4.2.8.2 and 5.2.8.2 3D Video Format in Normal mode
• 4.2.8.3 and 5.2.8.3 3D Video Format in Packed Pixel mode

 

Protocol tests for CTS 1.1, 1.2, 2.0 and CTS 1.3, 2.1

Source Protocol tests in both normal mode and PackedPixel mode

• Legal codes
• Basic protocol
• Packet types

 

Source Video tests in both Normal mode and PackedPixel mode

• Video formats test
• Pixel encoding test
• Video quantization ranges
• AVI info frame